Film Thickness Measurement Device
A film thickness measurement device designed not only for research purposes but also for use in production environments.
The "Film Thickness Measurement Device" is a product from THETA METRISIS, handled by Outex. It is a film thickness measurement system that uses white light reflection spectroscopy, capable of measuring from the nano range to the micron range. A variety of models are available to suit different applications, ranging from portable types that are easy to carry to large stationary types. We offer numerous modules necessary for measurements in high temperatures, in liquids, microscope attachment types, gas chambers, flow cells, and more. This product is designed not only for research purposes but also with consideration for use in production environments. 【Features】 ■ Film thickness measurement system from nano range to micron range using white light reflection spectroscopy ■ A wide selection of models available to suit various applications ■ Numerous modules available ■ Usable for both research purposes and in production environments *For more details, please refer to the PDF document or feel free to contact us.
- Company：オーテックス
- Price：Other
